• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    The invention relates to an image pickup device for producing images of an object in contact or in close proximity with the device. The device comprises a sensor (10) and illumination means capable of emitting a first radiation intended to illuminate an object in order to obtain an image thereof, the sensor (10) comprising pixels (11) sensitive to a second radiation which is a function of the first radiation emitted by the lighting means. The sensor (10) is formed on a one-piece substrate comprising a plurality of passages (15) transparent to the first radiation. The illumination means comprise at least one source of first radiation arranged opposite one of the passages (15).
    公开号:FR3040577A1
    申请号:FR1558025
    申请日:2015-08-28
    公开日:2017-03-03
    发明作者:Puchades Josep Segura
    申请人:Commissariat a lEnergie Atomique CEA；Commissariat a lEnergie Atomique et aux Energies Alternatives CEA；
    IPC主号:
    专利说明:

    The invention relates to an image pickup device for producing images of an object in contact with or in immediate proximity with the device. This type of device can be used in many areas, such as in medical imaging to achieve live tissue images, in the recognition of people, for example for fingerprint sensors, in the control of materials ...
    The production of an image requires a sensor having a plurality of elements sensitive to radiation. These sensitive elements are called pixels and are usually organized in matrix. Each pixel provides a signal representative of the radiation it receives. An assembly of the signals from the different pixels makes it possible to form a two-dimensional image whose dimensions are a function of the number and organization of the pixels in the matrix.
    In the context of the invention, the radiation to which the sensor is sensitive may be of any kind, such as for example an electromagnetic radiation, any frequency of which may be used from ionizing radiation gamma or X to radiation of the Tera type. Hertz.
    The pixels receive radiation from an object whose image is to be made. This radiation can be reflected by the object or from a stimulation, for example in the case of fluorescence. To achieve this reflection or stimulation, a source of incident radiation is needed. When the image pickup device is in the immediate vicinity of the object whose image is to be obtained, the source is advantageously integrated into the device. The invention is more particularly concerned with integrated source devices.
    In small devices, it is possible to place the incident radiation source at the periphery of the sensor. In order to homogenize the illumination, it is possible to have several point sources around the sensor. This provision does not allow to completely homogenize the illumination. Indeed, the pixels at the center of the sensor are much farther away from the light sources than the pixels located at the periphery and the differences in illumination can be detrimental to the image resulting from a sensor thus produced.
    In order to bring the pixels closer to the light source, it is also possible to reduce the size of the sensor. To make a large image, it is then possible to juxtapose several sensors leaving a gap between the sensors. We can then have a light source in the gap. The presence of several sensors causes difficulties in positioning the sensors together to align them. The number of sensors and the positioning difficulties tend to increase the cost of the device.
    It has also been attempted to produce a partially transparent sensor for the radiation of the incident radiation source. More precisely, the sensor can be transparent between the pixels. The radiation source is not punctual. It extends over the entire surface of the sensor. This embodiment nevertheless has several disadvantages: • It is necessary to reduce the fill factor of the sensor to provide a sufficient passage area for the radiation between the pixels. In other words, it is necessary to reduce the useful area of the pixels, which penalizes the sensitivity of the device. • The radiation passing through the sensor can be directly captured by the pixels, which is not desired. • The cost of such a device increases with the difficulty to achieve a distributed radiation source and the obligation to protect the pixels direct radiation from the source. • Even if the radiation coming from the source is not directly captured by the sensitive elements, parasitic currents can be generated by the illumination in components, such as transistors, present in each of the pixels in addition to the element sensitive. The invention aims to overcome all or part of the problems mentioned above by providing a low-cost image pickup device whose sensor is monobloc. To this end, the subject of the invention is an image pickup device comprising a sensor and lighting means capable of emitting a first radiation intended to illuminate an object in order to obtain an image thereof, the sensor comprising pixels that are sensitive to a light. second radiation according to the first radiation emitted by the illumination means, characterized in that the sensor is formed on a one-piece substrate comprising a plurality of transparent passages to the first radiation, which the illumination means comprise at least one source of first radiation arranged next to one of the passages.
    Pixels can be organized in a matrix fashion. Each of the passages then occupies the position of several contiguous pixels.
    The passages are advantageously distributed uniformly in the matrix in order to improve the homogeneity of the illumination of the object.
    The contiguous pixels of the passages are advantageously inactive.
    The device may include components for driving and reading pixels. The sensor then comprises tracks connecting each of the pixels to the components, each track being routed along a row of pixels. For rows interrupted by passages, the corresponding tracks are diverted around the passages by unbroken adjacent rows.
    The substrate comprises a front face carrying pixels, and a rear face opposite to the front face. The sensor may comprise an opaque mask with the first radiation, the mask being disposed on the rear face.
    The lighting means may comprise a second substrate carrying at least one source of first radiation, the second substrate being parallel to the one-piece substrate said first substrate on which the photosensitive elements are formed.
    The first substrate and the second substrate are advantageously flexible, for example to match the shape of the object.
    The second substrate comprises a front face disposed facing the sensor. The illumination means may comprise a mask that is opaque to the radiation emitted by the at least one source of first radiation, the mask being disposed on the front face, the mask of the illumination means being perforated opposite the passages.
    The at least one source of first radiation may be disposed away from or in contact with the sensor.
    Each of the passages may be an opening through the sensor substrate or a transparent area of the sensor substrate. The invention will be better understood and other advantages will appear on reading the detailed description of an embodiment given by way of example, a description illustrated by the accompanying drawing in which: FIG. 1 represents an example of a sensor be implemented in a device according to the invention; FIGS. 2a and 2b show more precisely, around a passage of the sensor of FIG. 1, the routing of conductors making it possible to drive the pixels of the sensor; Figure 3 shows, always around a passage, a sensor variant in which the passage is larger than that shown in Figures 2a and 2b; FIG. 4 is an exploded view of a device according to the invention; FIGS. 5a to 5d show several alternative embodiments of lighting means implemented in a device according to the invention; Figure 6 shows an exploded view another device according to the invention; FIGS. 7a and 7b show an exemplary device according to the invention implemented for a biomedical analysis; FIG. 8 represents another example of a device implemented for a material analysis.
    For the sake of clarity, the same elements will bear the same references in the different figures.
    Figure 1 shows a sensor 10 formed on a one-piece substrate. The sensor 10 comprises pixels 11 sensitive to radiation, for example electromagnetic radiation. The pixels 11 are, in the example shown, regularly distributed on the surface of the sensor 10. The pixels are organized in a matrix formed of rows and columns of pixels 11. Other irregular organizations are also possible in the context of the invention. In Figure 1 each pixel has the shape of a square. Pixels 11 are considered joined. In practice, a pixel comprises a radiation sensitive element and generally one or more components, necessary for the operation of the pixel, such as for example one or more transistors. In each of the squares shown in Figure 1, are disposed a sensing element and the associated component (s). In the surface of a square, one can also find tracks for conveying signals from or to each pixel. At the periphery of the sensor, on the substrate, specific components are provided distributed in two zones 12 and 13. These components make it possible in particular to control and read the pixel matrix 11. The specific components can be offset to another substrate. The zones 12 and 13 then form connection zones between the pixels 11 and the specific remote components. In the example shown, two areas appear. It is also possible to make sensors having another number of zones.
    According to the invention, the sensor comprises several passages 15 intended to let each radiation from a source of radiation. The passages 15 may be openings passing through the substrate of the sensor 10, for example holes made in the substrate. Alternatively it is possible to maintain a continuous planar substrate. The passages 15 are then made in the form of transparent areas of the substrate. The passages advantageously occupy the position of several contiguous pixels 11. In the example shown, each passage 15 occupies a square of two times two pixels. Other arrangements are possible. In particular, it is possible to provide larger squares or even rectangles (number of different pixels in the two directions of the matrix.) The dimensions of the passages are chosen as a function of those of the incident incident radiation sources. allow to have there incident radiation sources for illuminating an object whose image is to be made by means of the sensor 10.
    In order to obtain a good homogeneity of the illumination resulting from the incident radiation sources, the passages 15 are advantageously uniformly distributed in the matrix of pixels. More precisely, the number of pixels 11 separating two adjacent passages 15 is identical for all pairs of neighboring passages and this in the two directions of the matrix.
    Each pixel 11 delivers information based on radiation from the illuminated object either by reflection of the radiation incident on the object or by stimulation of the object by the incident radiation. Thereafter, we will call: first radiation, the incident radiation emitted by the sources intended to illuminate the object and second radiation the radiation coming from the object.
    In the sensor 10, at each passage 15, pixels are missing. To obtain a complete image of the object, it is possible to perform a processing to reconstruct the information that should have come from the missing pixels, for example from averages of information from the neighboring pixels 11.
    Figures 2a and 2b partially show the sensor 10 around a passage 15. The various pixels 11 of the matrix are connected to the zones 12 and 13 by tracks. For example, the zone 12 can be used to control the pixels. Each line of pixels 11 is connected by one or more tracks to zone 12. It is possible, for example, to provide two tracks per pixel line 11, one track for resetting pixels 11 and another track for selecting the line of pixels. Similarly, each column of pixels 11 is connected by one or more tracks to the zone 13. For each column, a track can connect the pixels 11 of the column to a read circuit located in the zone 13. Other tracks can be provided in line or in column for the supply of pixels.
    In Figure 2a, a single track per pixel line 11 is shown to not overload the figure. Likewise in FIG. 2b, only one track per pixel column 11 is shown. When multiple tracks are needed per row or column, they follow parallel routes. To ensure the crossing of the tracks arranged in line and in column, they can be arranged on different layers of the substrate layers separated by an insulator.
    FIGS. 2a and 2b show six lines marked 21 to 26 and six columns of pixels marked 31 to 36. In FIG. 2a, for each line, the track represented is indicated by the reference of the corresponding line followed by the letter "at". Similarly, in FIG. 2b, for each column, the track represented is indicated by the reference of the corresponding column followed by the letter "b". The lines 21, 22, 25 and 26 are not interrupted by a passage 15 and the corresponding tracks 21a, 22a, 25a and 26a follow the pixels 11 of their respective line. On the other hand, for the lines 23 and 24, pixels are missing at the level of the columns 33 and 34. These four missing pixels form the passage 15. The routing of the tracks 23a and 24a is deflected in the pixels situated in the vicinity of the passage 15. following the nearest uninterrupted pixel line. More precisely, the track 23a is deflected by the pixels of the line 22 and the track 24a is deflected by the pixels of the line 25 in the vicinity of the passage 15.
    Similarly, the routing of the tracks 33b and 34b is deflected in the pixels located in the vicinity of the passage 15 by following the nearest uninterrupted pixel column. More precisely, the track 33b is deflected by the pixels of the column 32 and the track 34b is deflected by the pixels of the column 35 in the vicinity of the passage 15.
    The contiguous pixels of the passages 15 are advantageously inactive, mainly because of the particular routing of the deviated tracks passing through these pixels. In Figures 2a and 2b, these pixels located at the periphery of the passage 15 are represented in a gray manner. Indeed, these pixels can receive the first radiation directly without reflection on the object. In other words, these pixels may be dazzled by the radiation source passing through the pixel 15. The information they deliver may be erroneous. To make them inactive, it is possible to delete the sensitive element that they contain, which facilitates the routing of deviated tracks. Alternatively, it is possible to keep the same pattern for all pixels, active or inactive. The inactive pixels therefore each retain a sensitive element that can be connected to the zones 12 and 13 as for the other pixels. The image processing is designed to ignore the information received from the pixels 11 contiguous to the passages 15. As for the missing pixels, the image can be reconstructed from the active neighboring pixels 11.
    Figure 3 shows a sensor variant in which the passage 15 is larger than that shown in Figures 2a and 2b. The passage shown in Figure 3 occupies an area of four pixels by four pixels. Ten lines marked 41 to 50 are represented. As before, for each line, the track represented is indicated by the reference of the corresponding line followed by the letter "a".
    The lines 41, 42, 43, 48, 49 and 50 are not interrupted by a passage 15 and the corresponding tracks 41a, 42a, 43a, 48a, 49a and 50a follow the pixels 11 of their respective line. On the other hand, for the lines 44, 45, 46 and 47, pixels are missing to form the passage 15. The routing of the tracks 44a, 45a, 46a and 47a is deflected in the pixels situated in the vicinity of the passage 15 following the line uninterrupted pixel level. More specifically, the tracks 44a and 45a are deflected by the pixels of the line 43 and the tracks 46a and 47a are deflected by the pixels of the line 48 in the vicinity of the passage 15. In this variant, three tracks follow the pixels of the line 43 and three tracks follow the pixels of the line 48 to bypass the passage 15. The same type of deviation in the vicinity of the passage 15 is made for the tracks flowing in the columns of pixels.
    Alternatively, it is possible to reduce the number of tracks flowing in the same row of pixels, for example by making a maximum of only two tracks per pixel line, by routing through line 43 only tracks 44a and 45a. The track 43a is deflected by the line 42 although it does not include a missing pixel. Thus, two tracks follow line 43 and two tracks follow line 42. This arrangement makes it possible to maintain a greater width of track and a distance between neighboring tracks than in the variant represented in FIG. 3. It is possible to make all pixels through which deviated tracks pass.
    FIG. 4 is an exploded view of an image pickup device 60 comprising the sensor 10 made on a substrate 61. The device 60 comprises illumination means 62 of an object whose image is to be obtained. The lighting means comprise a substrate 63 and sources 64 of the first radiation. The two substrates are for example arranged in contact with each other. The first radiation passes through the passages 15 made in the substrate 61. It is advantageous to have two distinct substrates 61 and 63, one for the sensor 10 and the other for the illumination means 62 in order to separate the function sensor 10 which is to wear the pixels and that of the illumination means 62 which is to illuminate the object. It is possible to place on a rear face 66 of the sensor 10, face opposite to a front face 65 of the sensor 10 carrying the sensitive elements, a mask 67 opaque to the first radiation in order to protect the components of the sensor from any direct illumination coming from the means 62. The mask 67 may cover the entire rear face 67. The mask 67 is interrupted by the passages 15. The substrate 61 may be made of a material transparent to the radiation from the illumination means 62, for example glass or a transparent plastic material.
    The sources 64 may be formed of light-emitting diodes forming quasi-point sources. The sources 64 are mounted on a front face 68 of the substrate 63 coming into contact with the rear face 66 of the sensor 10. The sources 64 may be prominent with respect to the front face 68 and may each be inserted into one of the passages 15. Lighting means 62 may comprise other components, in particular for the operation of the sources 64. For example, it may be polarization resistors of light emitting diodes used as sources 64 or else selection transistors. In general, these other components are advantageously arranged on a rear face 69 of the substrate 63, the rear face 69 is opposite to the front face 68.
    FIGS. 5a to 5d show several alternative embodiments of the lighting means 62 using organic light-emitting diodes, in particular light-emitting diode polymers known in the English literature by the acronym PLED for "Polymer Light-Emitting Diodes" . Some polymers used in this type of diode remain in liquid form. They can be deposited in a thin layer without the need for vacuum deposition. The substrate 63 may be flexible. In FIG. 5a, a plurality of independent diodes 71 are deposited on the substrate 63 and more precisely on its front face 68. The distribution of the diodes 71 on the substrate 63 corresponds to the distribution of the passages 15 on the substrate 61. The diodes 71 can be driven individually or in groups. In FIG. 5b, diodes 72 are produced in lines each corresponding to a line of passage 15. In FIG. 5c, a single diode 73 occupies the entire surface of the substrate 63. FIG. 5d shows the arrangement of the diodes 71, 72 or 73. A mask 75 opaque to the radiation emitted by the diodes has been added to the front face 68. The mask 75 is perforated with respect to the passages 15.
    FIG. 6 shows another embodiment of an image pickup device 77 adjacent to the device 60 represented in FIG. 4. The device 77 is suitable for X-ray imaging or so-called Tera-Hertz imaging. These terra-hertz rays are sometimes called far-infrared. They are located in a frequency band between near infrared visible and microwaves, typically between 0.1 and 10 terra-Hertz. Tera-Hertz rays can be used in the field of medical diagnosis, nondestructive testing or safety.
    The sensor 10 is found in the device 77. The lighting means here bear the reference 78. This is a source emitting radiation in the selected frequency band. The source 78 is disposed at a distance from the sensor 10 on the side of the rear face 66. The sensor 10 also comprises a mask 67 opaque to radiation from the source 78. As in the device 60, the radiation from the source 77 passes through the passages 15 to illuminate an object whose image is desired.
    FIGS. 7a and 7b show an example of an imaging device 80 used for a biomedical analysis. The device 80 is in contact with the skin 81 of a patient for example to detect tumors or to locate the arteries and veins. The two substrates 61 and 63 are flexible in order to make the device 80 flexible to fit the surface of the skin 81. The zones 12 and 13 form zones of connection between the pixels 11 disposed on the substrate 61 and components 83 disposed on the substrate 63. The components 83 allow the control of the pixels 11 and their reading. The substrate 63 also comprises connection zones 85 bearing against the connection zones 12 and 13 in order to ensure electrical contact between them. The sources 64 are, for example, infrared emitters and the pixels 11 are sensitive to infrared radiation re-emitted differently depending on the biological nature of the skin tissues 81.
    FIG. 8 represents another example of an imaging device used for a material analysis. The device of Figure 7 is similar to the device 80 of Figures 6a and 6b. It contains the two substrates 61 and 63. The substrate 61 is pierced to let the sources 64. For the material analysis, the sources 64 may be for example visible radiation sources, laser or not, hot spots made from heating resistors, X-ray emitters ... In practice, any form of substantially point source can be used to illuminate the object of which an image is desired.
    权利要求:
    Claims (12)
    [1" id="c-fr-0001]
    An image pickup device comprising a sensor (10) and illumination means capable of emitting a first radiation for illuminating an object (81) to obtain an image thereof, the sensor (10) comprising pixels (11) responsive to a second radiation as a function of the first radiation emitted by the illumination means, characterized in that the sensor (10) is formed on a one-piece substrate (61) comprising a plurality of passages (15) transparent to the first radiation, which means at least one source (64; 71; 72; 73; 78) of first radiation arranged opposite one of the passages (15).
    [2" id="c-fr-0002]
    2. Device according to claim 1, characterized in that the pixels (11) are organized in a matrix manner and in that each of the passages (15) occupies the position of several contiguous pixels (11).
    [3" id="c-fr-0003]
    3. Device according to claim 2, characterized in that the passages (15) are distributed uniformly in the matrix.
    [4" id="c-fr-0004]
    4. Device according to one of claims 2 or 3, characterized in that the pixels (11) contiguous passages (15) are inactive.
    [5" id="c-fr-0005]
    5. Device according to one of claims 2 to 4, characterized in that it comprises components (12, 13, 83) for controlling and reading the pixels (11), in that the sensor (10) comprises tracks (21a to 26a, 31b to 36b, 41a to 50a) connecting each of the pixels (11) to the components (12, 13, 83), each track (21a to 26a, 31b to 36b, 41a to 50a) being routed following a row (21 to 26, 31 to 36, 41 to 50) of pixels (11) and in that for interrupted rows (23, 24, 33, 34, 44 to 47) by passages (15), the corresponding tracks (23a, 24a, 33a, 34a, 44a to 47a) are deflected around the passages (15) by unbroken adjacent rows (22, 25, 32, 35, 43, 48).
    [6" id="c-fr-0006]
    6. Device according to one of the preceding claims, characterized in that the substrate (61) comprises a front face (65) carrying pixels (11), and a rear face (67) opposite the front face (65), and in that the sensor (10) comprises a mask (67) opaque to the first radiation, the mask (67) being arranged on the rear face (67).
    [7" id="c-fr-0007]
    7. Device according to one of the preceding claims, characterized in that the lighting means comprise a second substrate (63) carrying the least one source (64; 71; 72; 73) of first radiation, the second substrate (63; ) being parallel to the monoblock substrate said first substrate (61) on which the photosensitive elements (11) are formed.
    [8" id="c-fr-0008]
    8. Device according to claim 7, characterized in that the first substrate (61) and the second substrate (63) are flexible.
    [9" id="c-fr-0009]
    9. Device according to one of claims 7 or 8, characterized in that the second substrate (63) comprises a front face (68) disposed opposite the sensor (10) and in that the lighting means comprise a mask (75) opaque to the radiation emitted by the at least one source (64; 71; 72; 73) of first radiation, the mask (75) being disposed on the front face (68), the mask (75) means of lighting being openwork facing the passages (15).
    [10" id="c-fr-0010]
    10. Device according to one of claims 1 to 6, characterized in that the at least one source (78) of first radiation is disposed at a distance from the sensor (10).
    [11" id="c-fr-0011]
    11. Device according to one of the preceding claims, characterized in that each of the passages (15) is an opening through the substrate (61) of the sensor (10).
    [12" id="c-fr-0012]
    12. Device according to one of claims 1 to 10, characterized in that each of the passages (15) is a transparent area of the substrate (61) of the sensor (10).
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    EP3144704A3|2017-05-24|
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    引用文献:
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    法律状态:
    2016-08-31| PLFP| Fee payment|Year of fee payment: 2 |
    2017-03-03| PLSC| Publication of the preliminary search report|Effective date: 20170303 |
    2017-08-31| PLFP| Fee payment|Year of fee payment: 3 |
    2018-08-30| PLFP| Fee payment|Year of fee payment: 4 |
    2019-08-30| PLFP| Fee payment|Year of fee payment: 5 |
    2020-08-31| PLFP| Fee payment|Year of fee payment: 6 |
    2021-08-31| PLFP| Fee payment|Year of fee payment: 7 |
    优先权:
    申请号 | 申请日 | 专利标题
    FR1558025|2015-08-28|
    FR1558025A|FR3040577B1|2015-08-28|2015-08-28|IMAGE RECEIVER WITH INTEGRATED LIGHTING|FR1558025A| FR3040577B1|2015-08-28|2015-08-28|IMAGE RECEIVER WITH INTEGRATED LIGHTING|
    EP16185946.7A| EP3144704A3|2015-08-28|2016-08-26|Image sensor device with integrated lighting and method for producing the device|
    US15/248,176| US9865764B2|2015-08-28|2016-08-26|Image capture device with integrated illumination and method for producing the device|
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